Yao-Feng Chang
Dr. Yao-Feng Chang is a part of the Technology and Development, Quality and Reliability (TD Q&R) staff at Intel. He received a Ph.D. from the Department of Electrical and Computer Engineering, University of Texas at Austin, USA, in 2015. His primary research focuses on emerging electronics and memory devices for advanced technology nodes for storage, computation, and energy-efficient integrated systems. He has published more than 100 journal publications and conference proceedings as well as five patents.